TY - JOUR
T1 - Combined x-ray photoelectron spectroscopy/ultraviolet photoelectron spectroscopy/field emission spectroscopy for characterization of electron-emission mechanism of diamond
AU - Yamaguchi, H.
AU - Kudo, Y.
AU - Masuzawa, T.
AU - Kudo, M.
AU - Yamada, T.
AU - Takakuwa, Y.
AU - Okano, K.
N1 - Funding Information:
The authors acknowledge Mr. Shuichi Ogawa of Tohoku University for the experimental support on the UPS measurement and Mr. Yoshifumi Shiraki of International Christian University for experimental support. The present work was financially supported in part by Academic Frontier Project, and the Grant-in-Aid for Scientific Research (A) (No. 19205026) from the Ministry of Education, Science, Sports and Culture, Japan.
PY - 2008
Y1 - 2008
N2 - A possible mechanism for the field emission spectroscopy (FES) peak energy shift observed for lightly nitrogen (N)-doped chemical vapor deposition (CVD) diamond was investigated using natural IIb diamond as a reference. Combined ultraviolet photoelectron spectroscopy/FES spectra of natural IIb diamond indicated that the origin of field-emitted electrons is at the valence-band maximum and does not shift depending on the applied voltages. To further investigate the mechanism, FES peak energy was plotted versus emission current and the plot was best fitted to a straight line. The resistance of the diamond obtained from the slope was 109 and almost 0 for natural IIb diamond and lightly N-doped CVD diamond, respectively. The result was confirmed to be consistent with the resistivity of lightly N-doped CVD diamond and natural IIb diamond. Therefore, the result strongly implies that the observed energy shift is due to the voltage drop at the field emission site due to the resistance of the diamond bulk. Details of a possible mechanism are explained.
AB - A possible mechanism for the field emission spectroscopy (FES) peak energy shift observed for lightly nitrogen (N)-doped chemical vapor deposition (CVD) diamond was investigated using natural IIb diamond as a reference. Combined ultraviolet photoelectron spectroscopy/FES spectra of natural IIb diamond indicated that the origin of field-emitted electrons is at the valence-band maximum and does not shift depending on the applied voltages. To further investigate the mechanism, FES peak energy was plotted versus emission current and the plot was best fitted to a straight line. The resistance of the diamond obtained from the slope was 109 and almost 0 for natural IIb diamond and lightly N-doped CVD diamond, respectively. The result was confirmed to be consistent with the resistivity of lightly N-doped CVD diamond and natural IIb diamond. Therefore, the result strongly implies that the observed energy shift is due to the voltage drop at the field emission site due to the resistance of the diamond bulk. Details of a possible mechanism are explained.
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U2 - 10.1116/1.2837872
DO - 10.1116/1.2837872
M3 - Article
AN - SCOPUS:41549125897
VL - 26
SP - 730
EP - 734
JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
SN - 1071-1023
IS - 2
ER -