Collateral evidence for an excellent radiative performance of Al xGa1-xN alloy films of high AlN mole fractions

S. F. Chichibu, K. Hazu, T. Onuma, A. Uedono

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25 Citations (Scopus)

Abstract

Recombination dynamics for the deep-ultraviolet (DUV) near-band-edge emission of AlxGa1-xN epilayers of high AlN mole fractions (x) are studied using time-resolved spectroscopy. Their low-temperature radiative lifetime (R) is longer than that for the epilayers of low-x AlxGa1-xN, AlN, or GaN due to the contribution of bound and localized tail-states. However, R shows little change with temperature rise, and the value is a few ns at 300 K. The results essentially indicate an excellent radiative performance of Al xGa1-xN alloys of high x, although the luminescence efficiency of AlxGa1-xN DUV light-emitting-diodes reported so far is limited by the short nonradiative lifetime.

Original languageEnglish
Article number051902
JournalApplied Physics Letters
Volume99
Issue number5
DOIs
Publication statusPublished - 2011 Aug 1

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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