Coincidence doppler broadening of positron annihilation radiation for detection of helium in irradiated Ni and Cu

Q. Xu; T. Ishizaki; K. Sato; T. Yoshiie; S. Nagata

doi:10.2320/matertrans.47.2885

Coincidence doppler broadening of positron annihilation radiation for detection of helium in irradiated Ni and Cu

Q. Xu, T. Ishizaki, K. Sato, T. Yoshiie, S. Nagata

Materials Design Division

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

A new composition analysis method, namely, coincidence Doppler broadening (CDB) of positron annihilation radiation, was employed to detect He atoms in ion irradiated Ni and neutron irradiated Cu. The results of positron lifetime and transmission electron microscopy (TEM) show that microvoids and voids were formed in ion-irradiated Ni and neutron-irradiated Cu, respectively. The results of CDB measurements indicate that He atoms were present in the microvoids and voids, even in microvoids annealed at 1273 K in ion-irradiated Ni. Coincidence Doppler broadening measurement, which is a nondestructive technique for testing materials, is effective for detecting He atoms.

Original language	English
Pages (from-to)	2885-2887
Number of pages	3
Journal	Materials Transactions
Volume	47
Issue number	11
DOIs	https://doi.org/10.2320/matertrans.47.2885
Publication status	Published - 2006 Nov

Keywords

Helium
Microvoids
Positron annihilation
Voids

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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abstract = "A new composition analysis method, namely, coincidence Doppler broadening (CDB) of positron annihilation radiation, was employed to detect He atoms in ion irradiated Ni and neutron irradiated Cu. The results of positron lifetime and transmission electron microscopy (TEM) show that microvoids and voids were formed in ion-irradiated Ni and neutron-irradiated Cu, respectively. The results of CDB measurements indicate that He atoms were present in the microvoids and voids, even in microvoids annealed at 1273 K in ion-irradiated Ni. Coincidence Doppler broadening measurement, which is a nondestructive technique for testing materials, is effective for detecting He atoms.",

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author = "Q. Xu and T. Ishizaki and K. Sato and T. Yoshiie and S. Nagata",

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T1 - Coincidence doppler broadening of positron annihilation radiation for detection of helium in irradiated Ni and Cu

AU - Xu, Q.

AU - Ishizaki, T.

AU - Sato, K.

AU - Yoshiie, T.

AU - Nagata, S.

PY - 2006/11

Y1 - 2006/11

N2 - A new composition analysis method, namely, coincidence Doppler broadening (CDB) of positron annihilation radiation, was employed to detect He atoms in ion irradiated Ni and neutron irradiated Cu. The results of positron lifetime and transmission electron microscopy (TEM) show that microvoids and voids were formed in ion-irradiated Ni and neutron-irradiated Cu, respectively. The results of CDB measurements indicate that He atoms were present in the microvoids and voids, even in microvoids annealed at 1273 K in ion-irradiated Ni. Coincidence Doppler broadening measurement, which is a nondestructive technique for testing materials, is effective for detecting He atoms.

AB - A new composition analysis method, namely, coincidence Doppler broadening (CDB) of positron annihilation radiation, was employed to detect He atoms in ion irradiated Ni and neutron irradiated Cu. The results of positron lifetime and transmission electron microscopy (TEM) show that microvoids and voids were formed in ion-irradiated Ni and neutron-irradiated Cu, respectively. The results of CDB measurements indicate that He atoms were present in the microvoids and voids, even in microvoids annealed at 1273 K in ion-irradiated Ni. Coincidence Doppler broadening measurement, which is a nondestructive technique for testing materials, is effective for detecting He atoms.

KW - Helium

KW - Microvoids

KW - Positron annihilation

KW - Voids

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Coincidence doppler broadening of positron annihilation radiation for detection of helium in irradiated Ni and Cu

Abstract

Keywords

ASJC Scopus subject areas

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