TY - JOUR
T1 - Coincidence doppler broadening of positron annihilation radiation for detection of helium in irradiated Ni and Cu
AU - Xu, Q.
AU - Ishizaki, T.
AU - Sato, K.
AU - Yoshiie, T.
AU - Nagata, S.
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2006/11
Y1 - 2006/11
N2 - A new composition analysis method, namely, coincidence Doppler broadening (CDB) of positron annihilation radiation, was employed to detect He atoms in ion irradiated Ni and neutron irradiated Cu. The results of positron lifetime and transmission electron microscopy (TEM) show that microvoids and voids were formed in ion-irradiated Ni and neutron-irradiated Cu, respectively. The results of CDB measurements indicate that He atoms were present in the microvoids and voids, even in microvoids annealed at 1273 K in ion-irradiated Ni. Coincidence Doppler broadening measurement, which is a nondestructive technique for testing materials, is effective for detecting He atoms.
AB - A new composition analysis method, namely, coincidence Doppler broadening (CDB) of positron annihilation radiation, was employed to detect He atoms in ion irradiated Ni and neutron irradiated Cu. The results of positron lifetime and transmission electron microscopy (TEM) show that microvoids and voids were formed in ion-irradiated Ni and neutron-irradiated Cu, respectively. The results of CDB measurements indicate that He atoms were present in the microvoids and voids, even in microvoids annealed at 1273 K in ion-irradiated Ni. Coincidence Doppler broadening measurement, which is a nondestructive technique for testing materials, is effective for detecting He atoms.
KW - Helium
KW - Microvoids
KW - Positron annihilation
KW - Voids
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U2 - 10.2320/matertrans.47.2885
DO - 10.2320/matertrans.47.2885
M3 - Article
AN - SCOPUS:33846306389
VL - 47
SP - 2885
EP - 2887
JO - Materials Transactions
JF - Materials Transactions
SN - 1345-9678
IS - 11
ER -