Coherent X-ray diffractive imaging

Research output: Contribution to journalArticle

Abstract

Coherent X-ray diffractive imaging (CXDI) allows us to observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution and/or strain distribution. We have developed high-resolution diffractive imaging apparatus using the high-intensity X-ray beam focused by total reflection mirrors at SPring-8 and have demonstrated high-resolution plane-wave CXDI and scanning CXDI (i.e. X-ray ptychography). In addition, we have demonstrated element-specific X-ray ptychography using anomalous scattering around a specific element. In the near future, CXDI will become a promising tool for structure investigation in various fields including high-pressure science.

Original languageEnglish
Pages (from-to)237-244
Number of pages8
JournalReview of High Pressure Science and Technology/Koatsuryoku No Kagaku To Gijutsu
Volume23
Issue number3
DOIs
Publication statusPublished - 2013 Jan 1
Externally publishedYes

Keywords

  • Coherent X-ray diffractive imaging
  • Phase retrieval
  • Ptychography

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Coherent X-ray diffractive imaging'. Together they form a unique fingerprint.

Cite this