Coherent diffraction microscopy at SPring-8: Instrumentation, data acquisition and data analysis

Rui Xu; Sara Salha; Kevin S. Raines; Huaidong Jiang; Chien Chun Chen; Yukio Takahashi; Yoshiki Kohmura; Yoshinori Nishino; Changyong Song; Tetsuya Ishikawa; Jianwei Miao

doi:10.1107/S0909049510051733

Coherent diffraction microscopy at SPring-8: Instrumentation, data acquisition and data analysis

Rui Xu, Sara Salha, Kevin S. Raines, Huaidong Jiang, Chien Chun Chen, Yukio Takahashi, Yoshiki Kohmura, Yoshinori Nishino, Changyong Song, Tetsuya Ishikawa, Jianwei Miao

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples.

Original language	English
Pages (from-to)	293-298
Number of pages	6
Journal	Journal of Synchrotron Radiation
Volume	18
Issue number	2
DOIs	https://doi.org/10.1107/S0909049510051733
Publication status	Published - 2011 Mar
Externally published	Yes

Keywords

coherent diffraction imaging
coherent diffraction microscopy
lensless imaging
oversampling
phase retrieval

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Instrumentation

Access to Document

10.1107/S0909049510051733

Cite this

@article{98e9fcc4822849908a136068e6dd456a,

title = "Coherent diffraction microscopy at SPring-8: Instrumentation, data acquisition and data analysis",

abstract = "Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples.",

keywords = "coherent diffraction imaging, coherent diffraction microscopy, lensless imaging, oversampling, phase retrieval",

author = "Rui Xu and Sara Salha and Raines, {Kevin S.} and Huaidong Jiang and Chen, {Chien Chun} and Yukio Takahashi and Yoshiki Kohmura and Yoshinori Nishino and Changyong Song and Tetsuya Ishikawa and Jianwei Miao",

year = "2011",

month = mar,

doi = "10.1107/S0909049510051733",

language = "English",

volume = "18",

pages = "293--298",

journal = "Journal of Synchrotron Radiation",

issn = "0909-0495",

publisher = "International Union of Crystallography",

number = "2",

}

TY - JOUR

T1 - Coherent diffraction microscopy at SPring-8

T2 - Instrumentation, data acquisition and data analysis

AU - Xu, Rui

AU - Salha, Sara

AU - Raines, Kevin S.

AU - Jiang, Huaidong

AU - Chen, Chien Chun

AU - Takahashi, Yukio

AU - Kohmura, Yoshiki

AU - Nishino, Yoshinori

AU - Song, Changyong

AU - Ishikawa, Tetsuya

AU - Miao, Jianwei

PY - 2011/3

Y1 - 2011/3

N2 - Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples.

AB - Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples.

KW - coherent diffraction imaging

KW - coherent diffraction microscopy

KW - lensless imaging

KW - oversampling

KW - phase retrieval

UR - http://www.scopus.com/inward/record.url?scp=79951936906&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79951936906&partnerID=8YFLogxK

U2 - 10.1107/S0909049510051733

DO - 10.1107/S0909049510051733

M3 - Article

C2 - 21335919

AN - SCOPUS:79951936906

VL - 18

SP - 293

EP - 298

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

SN - 0909-0495

IS - 2

ER -

Coherent diffraction microscopy at SPring-8: Instrumentation, data acquisition and data analysis

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this