Abstract
Since the first demonstration of coherent diffraction microscopy in 1999, this lensless imaging technique has been experimentally refined by continued developments. Here, instrumentation and experimental procedures for measuring oversampled diffraction patterns from non-crystalline specimens using an undulator beamline (BL29XUL) at SPring-8 are presented. In addition, detailed post-experimental data analysis is provided that yields high-quality image reconstructions. As the acquisition of high-quality diffraction patterns is at least as important as the phase-retrieval procedure to guarantee successful image reconstructions, this work will be of interest for those who want to apply this imaging technique to materials science and biological samples.
Original language | English |
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Pages (from-to) | 293-298 |
Number of pages | 6 |
Journal | Journal of Synchrotron Radiation |
Volume | 18 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2011 Mar |
Keywords
- coherent diffraction imaging
- coherent diffraction microscopy
- lensless imaging
- oversampling
- phase retrieval
ASJC Scopus subject areas
- Radiation
- Nuclear and High Energy Physics
- Instrumentation