CoFeB Thickness Dependence of Damping Constants for Single and Double CoFeB-MgO Interface Structures

Eli Christopher I. Enobio; Hideo Sato; Shunsuke Fukami; Fumihiro Matsukura; Hideo Ohno

doi:10.1109/LMAG.2015.2475718

CoFeB Thickness Dependence of Damping Constants for Single and Double CoFeB-MgO Interface Structures

Eli Christopher I. Enobio, Hideo Sato, Shunsuke Fukami, Fumihiro Matsukura, Hideo Ohno

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

We investigate the CoFeB thickness dependence of the damping constant α of single and double CoFeB-MgO interface structures by vector-network-analyzer ferromagnetic resonance (VNA-FMR). The damping constant increases with decreasing the CoFeB thickness for the single interface structure, and the damping constant for the double-interface structure takes a similar value to that for the single-interface structures with the same CoFeB thickness.

Original language	English
Article number	5700303
Journal	IEEE Magnetics Letters
Volume	6
DOIs	https://doi.org/10.1109/LMAG.2015.2475718
Publication status	Published - 2015

Keywords

CoFeB-MgO
Spintronics
ferromagnetic resonance
magnetic tunnel junction

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

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@article{ffa21fb614cd4558b7354f13b6956ef9,

title = "CoFeB Thickness Dependence of Damping Constants for Single and Double CoFeB-MgO Interface Structures",

abstract = "We investigate the CoFeB thickness dependence of the damping constant α of single and double CoFeB-MgO interface structures by vector-network-analyzer ferromagnetic resonance (VNA-FMR). The damping constant increases with decreasing the CoFeB thickness for the single interface structure, and the damping constant for the double-interface structure takes a similar value to that for the single-interface structures with the same CoFeB thickness.",

keywords = "CoFeB-MgO, Spintronics, ferromagnetic resonance, magnetic tunnel junction",

author = "Enobio, {Eli Christopher I.} and Hideo Sato and Shunsuke Fukami and Fumihiro Matsukura and Hideo Ohno",

year = "2015",

doi = "10.1109/LMAG.2015.2475718",

language = "English",

volume = "6",

journal = "IEEE Magnetics Letters",

issn = "1949-307X",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - CoFeB Thickness Dependence of Damping Constants for Single and Double CoFeB-MgO Interface Structures

AU - Enobio, Eli Christopher I.

AU - Sato, Hideo

AU - Fukami, Shunsuke

AU - Matsukura, Fumihiro

AU - Ohno, Hideo

PY - 2015

Y1 - 2015

N2 - We investigate the CoFeB thickness dependence of the damping constant α of single and double CoFeB-MgO interface structures by vector-network-analyzer ferromagnetic resonance (VNA-FMR). The damping constant increases with decreasing the CoFeB thickness for the single interface structure, and the damping constant for the double-interface structure takes a similar value to that for the single-interface structures with the same CoFeB thickness.

AB - We investigate the CoFeB thickness dependence of the damping constant α of single and double CoFeB-MgO interface structures by vector-network-analyzer ferromagnetic resonance (VNA-FMR). The damping constant increases with decreasing the CoFeB thickness for the single interface structure, and the damping constant for the double-interface structure takes a similar value to that for the single-interface structures with the same CoFeB thickness.

KW - CoFeB-MgO

KW - Spintronics

KW - ferromagnetic resonance

KW - magnetic tunnel junction

UR - http://www.scopus.com/inward/record.url?scp=84944081260&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84944081260&partnerID=8YFLogxK

U2 - 10.1109/LMAG.2015.2475718

DO - 10.1109/LMAG.2015.2475718

M3 - Article

AN - SCOPUS:84944081260

VL - 6

JO - IEEE Magnetics Letters

JF - IEEE Magnetics Letters

SN - 1949-307X

M1 - 5700303

ER -