Co-concentration dependence of half-metallic properties in Co-Mn-Si epitaxial films

Y. Sakuraba, N. Hirose, M. Oogane, T. Nakamura, Y. Ando, K. Takanashi

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Abstract

Co-enriched Co2MnSi epitaxial films, i.e., Co 2(1+x)Mn1-xSi1-x (CCMS) were fabricated to investigate the Co-concentration dependence of half-metallicity in a Co-Mn-Si Heusler alloy. The tunnel magnetoresistance ratio in the magnetic tunnel junctions with a CCMS electrode slightly reduces with x from -0.02 to 0.13, then suddenly drops at x=0.20. The half-metallic gap in the G-V curve also disappears when x becomes 0.20. The multiplet structure in x-ray magnetic circular dichroism spectra around Co L-edges, implying half-metallicity of CCMS, also vanishes at x=0.20. These results consistently indicate the half-metallic nature of CCMS is destroyed when the Co atomic concentration is over 57 at. %.

Original languageEnglish
Article number092511
JournalApplied Physics Letters
Volume96
Issue number9
DOIs
Publication statusPublished - 2010 Mar 19

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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