Checkered white-RGB color LOFIC CMOS image sensor

Shun Kawada, Shin Sakai, Yoshiaki Tashiro, Shigetoshi Sugawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We succeeded in developing a checkered White-RGB color CMOS image sensor based on a lateral overflow integration capacitor (LOFIC) architecture. The LOFIC CMOS image sensor with a 1/3.3-inch optical format, 1280H x 480V pixels, 4.2-μm effective pixel pitch along with 45° direction was designed and fabricated through 0.18-μm 2-Poly 3-Metal CMOS technology with buried pinned photodiode (PD) process. The image sensor has achieved about 108-μV/e- high conversion gain and about 102-dB dynamic range (DR) performance in one exposure.

Original languageEnglish
Title of host publication2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
Pages347-348
Number of pages2
DOIs
Publication statusPublished - 2010 Apr 28
Event2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 - Taipei, Taiwan, Province of China
Duration: 2010 Jan 182010 Jan 21

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
CountryTaiwan, Province of China
CityTaipei
Period10/1/1810/1/21

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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  • Cite this

    Kawada, S., Sakai, S., Tashiro, Y., & Sugawa, S. (2010). Checkered white-RGB color LOFIC CMOS image sensor. In 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 (pp. 347-348). [5419870] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2010.5419870