Checker-pattern and shared two pixels LOFIC CMOS image sensors

Yoshiaki Tashiro, Shun Kawada, Shin Sakai, Shigetoshi Sugawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two wide dynamic range CMOS image sensors with lateral overflow integration capacitor have been developed. A checker-pattern image sensor has achieved high area efficiency by placing the color filters and on-chip microlens along the direction at an angle of 45°. A shared two pixels image sensor has achieved small pixel pitch by introducing a lateral overflow gate in each pixel. The fabricated image sensors exhibit high full well capacity, low noise, wide dynamic range and high resolution performance.

Original languageEnglish
Title of host publication2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
Pages343-344
Number of pages2
DOIs
Publication statusPublished - 2010 Apr 28
Event2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 - Taipei, Taiwan, Province of China
Duration: 2010 Jan 182010 Jan 21

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
CountryTaiwan, Province of China
CityTaipei
Period10/1/1810/1/21

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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  • Cite this

    Tashiro, Y., Kawada, S., Sakai, S., & Sugawa, S. (2010). Checker-pattern and shared two pixels LOFIC CMOS image sensors. In 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 (pp. 343-344). [5419872] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2010.5419872