TY - JOUR
T1 - Charge transport and mobility engineering in two-dimensional transition metal chalcogenide semiconductors
AU - Li, Song Lin
AU - Tsukagoshi, Kazuhito
AU - Orgiu, Emanuele
AU - Samorì, Paolo
N1 - Funding Information:
We acknowledge financial support from the European Commission through the Graphene Flagship (GA-604391), the FET project UPGRADE (No. 309056), the Agence Nationale de la Recherche through the LabEx project Nanostructures in Interaction with their Environment (ANR-11-LABX-0058_NIE), the Japan Society for the Promotion of Science (JSPS) through the Grant-in-Aid for Scientific Research (Kakenhi No. 25107004), and the International Center for Frontier Research in Chemistry (icFRC).
PY - 2016/1/7
Y1 - 2016/1/7
N2 - Two-dimensional (2D) van der Waals semiconductors represent the thinnest, air stable semiconducting materials known. Their unique optical, electronic and mechanical properties hold great potential for harnessing them as key components in novel applications for electronics and optoelectronics. However, the charge transport behavior in 2D semiconductors is more susceptible to external surroundings (e.g. gaseous adsorbates from air and trapped charges in substrates) and their electronic performance is generally lower than corresponding bulk materials due to the fact that the surface and bulk coincide. In this article, we review recent progress on the charge transport properties and carrier mobility engineering of 2D transition metal chalcogenides, with a particular focus on the markedly high dependence of carrier mobility on thickness. We unveil the origin of this unique thickness dependence and elaborate the devised strategies to master it for carrier mobility optimization. Specifically, physical and chemical methods towards the optimization of the major factors influencing the extrinsic transport such as electrode/semiconductor contacts, interfacial Coulomb impurities and atomic defects are discussed. In particular, the use of ad hoc molecules makes it possible to engineer the interface with the dielectric and heal the vacancies in such materials. By casting fresh light on the theoretical and experimental studies, we provide a guide for improving the electronic performance of 2D semiconductors, with the ultimate goal of achieving technologically viable atomically thin (opto)electronics.
AB - Two-dimensional (2D) van der Waals semiconductors represent the thinnest, air stable semiconducting materials known. Their unique optical, electronic and mechanical properties hold great potential for harnessing them as key components in novel applications for electronics and optoelectronics. However, the charge transport behavior in 2D semiconductors is more susceptible to external surroundings (e.g. gaseous adsorbates from air and trapped charges in substrates) and their electronic performance is generally lower than corresponding bulk materials due to the fact that the surface and bulk coincide. In this article, we review recent progress on the charge transport properties and carrier mobility engineering of 2D transition metal chalcogenides, with a particular focus on the markedly high dependence of carrier mobility on thickness. We unveil the origin of this unique thickness dependence and elaborate the devised strategies to master it for carrier mobility optimization. Specifically, physical and chemical methods towards the optimization of the major factors influencing the extrinsic transport such as electrode/semiconductor contacts, interfacial Coulomb impurities and atomic defects are discussed. In particular, the use of ad hoc molecules makes it possible to engineer the interface with the dielectric and heal the vacancies in such materials. By casting fresh light on the theoretical and experimental studies, we provide a guide for improving the electronic performance of 2D semiconductors, with the ultimate goal of achieving technologically viable atomically thin (opto)electronics.
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U2 - 10.1039/c5cs00517e
DO - 10.1039/c5cs00517e
M3 - Review article
AN - SCOPUS:84952665890
VL - 45
SP - 118
EP - 151
JO - Chemical Society Reviews
JF - Chemical Society Reviews
SN - 0306-0012
IS - 1
ER -