Charge ordered state in Yb4As3 studied by a resonant X-ray scattering technique

H. Nakao, K. Kiyoto, S. Kodama, D. Bizen, T. Matsumura, Kazuaki Iwasa, Y. Murakami, Akira Ochiai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The charge ordered state in Yb4As3 has been studied by a resonant x-ray scattering (RXS) technique near the Yb L3-edge. The anomalous scattering factors, f′ and f″, of Yb3+ and Yb2+ have been determined using the absorption spectrum of the Yb4As3. Based on the anomalous scattering factors, the valences of the two inequivalent Yb sites, +2 25 -δ and +2 25 + 3δ, have been evaluated by the RXS intensity corresponding to the charge ordering. The fully charge ordered state of δ = 0 25 ± 0 02 was elucidated.

Original languageEnglish
Title of host publicationLOW TEMPERATURE PHYSICS
Subtitle of host publication24th International Conference on Low Temperature Physics - LT24
Pages1175-1176
Number of pages2
DOIs
Publication statusPublished - 2006 Dec 1
EventLOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 - Orlando, FL, United States
Duration: 2006 Aug 102006 Oct 17

Publication series

NameAIP Conference Proceedings
Volume850
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherLOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24
CountryUnited States
CityOrlando, FL
Period06/8/1006/10/17

Keywords

  • Charge ordering
  • Resonant x-ray scattering
  • Short range order
  • Valence fluctuation

ASJC Scopus subject areas

  • Ecology, Evolution, Behavior and Systematics
  • Ecology
  • Plant Science
  • Physics and Astronomy(all)
  • Nature and Landscape Conservation

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    Nakao, H., Kiyoto, K., Kodama, S., Bizen, D., Matsumura, T., Iwasa, K., Murakami, Y., & Ochiai, A. (2006). Charge ordered state in Yb4As3 studied by a resonant X-ray scattering technique. In LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 (pp. 1175-1176). (AIP Conference Proceedings; Vol. 850). https://doi.org/10.1063/1.2355122