Charge injection process in organic field-effect transistors

Takeo Minari, Tetsuhiko Miyadera, Kazuhito Tsukagoshi, Yoshinobu Aoyagi, Hiromi Ito

Research output: Contribution to journalArticlepeer-review

128 Citations (Scopus)

Abstract

The charge injection process in top-contact organic field-effect transistors was energetically observed with displacement of the Fermi level as a result of scanning the gate voltage. Doping of charge-transfer molecules into the metal/organic interface resulted in low interface resistance, which unveiled the bulk transport of the injected charges from the contact metal into the channel. The authors found that the bulk transport clearly obeys the Meyer-Neldel rule, according to which the exponential density of states near the band edge limits the charge injection.

Original languageEnglish
Article number053508
JournalApplied Physics Letters
Volume91
Issue number5
DOIs
Publication statusPublished - 2007

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Charge injection process in organic field-effect transistors'. Together they form a unique fingerprint.

Cite this