Charge injection process in organic field-effect transistors

Takeo Minari, Tetsuhiko Miyadera, Kazuhito Tsukagoshi, Yoshinobu Aoyagi, Hiromi Ito

Research output: Contribution to journalArticlepeer-review

139 Citations (Scopus)


The charge injection process in top-contact organic field-effect transistors was energetically observed with displacement of the Fermi level as a result of scanning the gate voltage. Doping of charge-transfer molecules into the metal/organic interface resulted in low interface resistance, which unveiled the bulk transport of the injected charges from the contact metal into the channel. The authors found that the bulk transport clearly obeys the Meyer-Neldel rule, according to which the exponential density of states near the band edge limits the charge injection.

Original languageEnglish
Article number053508
JournalApplied Physics Letters
Issue number5
Publication statusPublished - 2007
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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