Charge gradient microscopy

Seungbum Hong, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Andreas Roelofs

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

Here we present a simple and fast method to reliably image polarization charges using charge gradient microscopy (CGM). We collected the current from the grounded CGM probe while scanning a periodically poled lithium niobate single crystal and single-crystal LiTaO3 thin film on the Cr electrode. We observed current signals at the domains and domain walls originating from the displacement current and the relocation or removal of surface charges, which enabled us to visualize the ferroelectric domains at a scan frequency above 78 Hz over 10 ìm. We envision that CGM can be used in high-speed ferroelectric domain imaging and piezoelectric energyharvesting devices.

Original languageEnglish
Pages (from-to)6566-6569
Number of pages4
JournalProceedings of the National Academy of Sciences of the United States of America
Volume111
Issue number18
DOIs
Publication statusPublished - 2014 May 6

Keywords

  • Atomic force microscopy
  • Charge scraping
  • Piezoresponse
  • Screen charge

ASJC Scopus subject areas

  • General

Fingerprint Dive into the research topics of 'Charge gradient microscopy'. Together they form a unique fingerprint.

  • Cite this