Charge counting readout LSI for x-ray imaging and its applications

Katsuyuki Takagi, Toshiyuki Takagi, Tsuyoshi Terao, Hisashi Morii, Akifumi Koike, Toru Aoki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

One of solutions to develop an energy resolved X-ray imager with sub-100μm pixel pitch is introduced. It consists of a small readout circuit and a data compressor in pixel. To realize spectroscopic readout circuit, charge counting architecture is adopted. And it equips time independence by removing transient response in analog signal processing and detector independence by controllability of time of signal processing for one pulse. An LSI implementing this system has been developed with 0.18um CMOS process. The pixel pitch is 80um and each pixel has 15 energy thresholds. The behavior of readout X-ray photon's energy and data compression for photon-counting imaging has been verified by using CdTe detector. Furthermore, supporting other detectors such as TlBr and other energy weighting function than photon-counting are progressing.

Original languageEnglish
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI
EditorsRalph B. James, Arnold Burger, Stephen A. Payne
PublisherSPIE
ISBN (Electronic)9781510629219
DOIs
Publication statusPublished - 2019
EventSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XXI - San Diego, United States
Duration: 2019 Aug 122019 Aug 14

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11114
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XXI
CountryUnited States
CitySan Diego
Period19/8/1219/8/14

Keywords

  • Charge-to-digital converter
  • Semiconductor detector
  • X-ray imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Takagi, K., Takagi, T., Terao, T., Morii, H., Koike, A., & Aoki, T. (2019). Charge counting readout LSI for x-ray imaging and its applications. In R. B. James, A. Burger, & S. A. Payne (Eds.), Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI [111140G] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11114). SPIE. https://doi.org/10.1117/12.2529747