Charge-carrier injection, extraction and trapping dynamics in organic thin-film transistors based on different organic semiconductors evaluated by displacement current measurements

Sibani Bisoyi, Reinhold Rodel, Ute Zschieschang, Kazuo Takimiya, Hagen Klauk, Shree Prakash Tiwari

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Organic thin-film transistors (TFTs) have potential as pixel drivers in flexible active-matrix organic light-emitting diode displays [1]. Hence it is essential to analyze the charge-carrier injection and extraction dynamics of organic TFTs to gain a better understanding of the trapping and detrapping at the TFT interfaces. From the current-voltage characteristics of the TFTs, many important parameters can be extracted, such as carrier mobility, threshold voltage, on/off ratio, subthreshold slope and transconductance. But to quantitatively evaluate the trapping and detrapping dynamics, displacement current measurements on two-terminal long-channel capacitors (LCCs) are far more useful [2, 3]. The cross-section and the layout of an LCC are schematically shown in Fig. 1. Unlike a TFT, an LCC has only one contact, so that carriers are injected into and extracted from the semiconductor through the same contact. To increase the signal-to-noise ratio, a very large channel length (up to 6 cm) is employed. While Liang et al. have performed displacement current measurements on pentacene-based LCCs [2,3], we report here on displacement current measurements on LCCs based on four different organic semiconductors: pentacene, dinaptho[2,3-b:2',3'-f]thieno[3,2-b]thiophene (DNTT), 2,9-didecyl-DNTT (C 10-DNTT) and diphenyl-DNTT (DPh-DNTT). In TFTs, these semiconductors show hole mobilities ranging from 1 to 7 cm2/Vs. The goal of the displacement current measurements reported here is to study how the choice of the semiconductor affects the trapping and detrapping dynamics in organic TFTs.

Original languageEnglish
Title of host publication72nd Device Research Conference, DRC 2014 - Conference Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages73-74
Number of pages2
ISBN (Print)9781479954056
DOIs
Publication statusPublished - 2014 Jan 1
Externally publishedYes
Event72nd Device Research Conference, DRC 2014 - Santa Barbara, CA, United States
Duration: 2014 Jun 222014 Jun 25

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Other

Other72nd Device Research Conference, DRC 2014
CountryUnited States
CitySanta Barbara, CA
Period14/6/2214/6/25

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Bisoyi, S., Rodel, R., Zschieschang, U., Takimiya, K., Klauk, H., & Tiwari, S. P. (2014). Charge-carrier injection, extraction and trapping dynamics in organic thin-film transistors based on different organic semiconductors evaluated by displacement current measurements. In 72nd Device Research Conference, DRC 2014 - Conference Digest (pp. 73-74). [6872303] (Device Research Conference - Conference Digest, DRC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DRC.2014.6872303