Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays

A. Niozu, Yoshiaki Kumagai, T. Nishiyama, H. Fukuzawa, K. Motomura, M. Bucher, Y. Ito, T. Takanashi, K. Asa, Y. Sato, D. You, Y. Li, T. Ono, E. Kukk, C. Miron, L. Neagu, C. Callegari, M. Di Fraia, G. Rossi, D. E. GalliT. Pincelli, A. Colombo, T. Kameshima, Y. Joti, T. Hatsui, S. Owada, T. Katayama, T. Togashi, K. Tono, M. Yabashi, K. Matsuda, C. Bostedt, K. Nagaya, Kiyoshi Ueda

Research output: Contribution to journalConference article

Abstract

We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

Original languageEnglish
Article number202028
JournalJournal of Physics: Conference Series
Volume1412
Issue number20
DOIs
Publication statusPublished - 2020 Jun 11
Event31st International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2019 - Deauville, France
Duration: 2019 Jul 232019 Jul 30

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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    Niozu, A., Kumagai, Y., Nishiyama, T., Fukuzawa, H., Motomura, K., Bucher, M., Ito, Y., Takanashi, T., Asa, K., Sato, Y., You, D., Li, Y., Ono, T., Kukk, E., Miron, C., Neagu, L., Callegari, C., Fraia, M. D., Rossi, G., ... Ueda, K. (2020). Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays. Journal of Physics: Conference Series, 1412(20), [202028]. https://doi.org/10.1088/1742-6596/1412/20/202028