We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - 2020 Jun 11|
|Event||31st International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2019 - Deauville, France|
Duration: 2019 Jul 23 → 2019 Jul 30
ASJC Scopus subject areas
- Physics and Astronomy(all)