@inproceedings{e3d83bc603d6487997f94707004bf2ea,
title = "Characterization of threading edge dislocation in 4H-SiC by X-ray topography and transmission electron microscopy",
abstract = "A threading dislocation (TD) in 4H-SiC, which was currently interpreted as a perfect threading edge dislocation (TED) by synchrotron monochromatic-beam X-ray topography (SMBXT) and molten KOH etching with Na2O2 additive, was investigated using weak-beam darkfield (WBDF) and large-angle convergent-beam electron diffraction (LACBED) methods. The TD was suggested to be dissociated into a dislocation pair which can be observed in the WBDF image of g=1210. The TD, which was identified as b//[1210] by SMBXT observation, was unambiguously determined as b=1/3[1210 ] by LACBED analysis. In the case of perfect TED, it was found that the direction of Burgers vector derived from SMBXT observation corresponds to LACBED analysis.",
keywords = "Burgers vector, Hexagonal SiC, Threading edge dislocation, Transmission electron microscopy, X-ray topography",
author = "Yoshihiro Sugawara and Yao, {Yong Zhao} and Yukari Ishikawa and Katsunori Danno and Hiroshi Suzuki and Takeshi Bessho and Satoshi Yamaguchi and Koichi Nishikawa and Yuichi Ikuhara",
note = "Copyright: Copyright 2020 Elsevier B.V., All rights reserved.; 15th International Conference on Silicon Carbide and Related Materials, ICSCRM 2013 ; Conference date: 29-09-2013 Through 04-10-2013",
year = "2014",
doi = "10.4028/www.scientific.net/MSF.778-780.366",
language = "English",
isbn = "9783038350101",
series = "Materials Science Forum",
publisher = "Trans Tech Publications Ltd",
pages = "366--369",
editor = "Hajime Okumura and Hajime Okumura and Hiroshi Harima and Tsunenobu Kimoto and Masahiro Yoshimoto and Heiji Watanabe and Tomoaki Hatayama and Hideharu Matsuura and Yasuhisa Sano and Tsuyoshi Funaki",
booktitle = "Silicon Carbide and Related Materials 2013",
}