Characterization of thermally annealed tunnel junctions with preoxidized CoFe pinned electrode

J. H. Lee, D. H. Im, C. S. Yoon, C. K. Kim, Y. Ando, H. Kubota, T. Miyazaki

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Thermally annealed tunnel junctions with preoxidized CoFe pinned electrode were studied. Auger electron spectroscopy and x-ray photoelectron spectroscopy techniques were used to observe the structural and chemical changes after annealing in the tunnel barrier as well as near the interface for magnetic tunnel junctions and plasma oxidized junctions. Changes in magnetic properties near the tunnel barrier during annealing were observed using depth-resolved x-ray magnetic circular dichroism (XMCD). The results show that the magnitude of spin polarized tunneling current is sensitive to the interface structure and any changes near the barrier interface during thermal annealing can alter the electrical properties of the magnetic tunnel junctions.

Original languageEnglish
Pages (from-to)7778-7783
Number of pages6
JournalJournal of Applied Physics
Volume94
Issue number12
DOIs
Publication statusPublished - 2003 Dec 15

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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