Characterization of the surface layer of LB-films using a slow positron beam

M. Koshimizu, K. Asai, K. Ishigure, T. Iwai, H. Shibata, Y. Ito

Research output: Contribution to journalConference articlepeer-review

Abstract

Langmuir-Blodgett films were studied using a variable energy slow-positron beam. We measured the energy spectra of positron annihilation radiation for Cd and Mg eicosanoid films and obtained the V- and S-parameters as a function of the incident positron energy, E. In the V-E curves of Cd eicosanoid films, there were dips at the positron energy whose mean implantation depth corresponding to the first and second Cd2+ layers from the surface. These dips are interpreted as the result of inhibition of Ps formation by the Cd2+ ions. The S-parameter was found to be sensitive to chemical composition of the film and also to possible structural change due to heat treatment. Our results suggest that positron beams provide valuable information about the microstructure of the Langmuir-Blodgett films. Copyright (C) 2000 Elsevier Science Ltd.

Original languageEnglish
Pages (from-to)633-637
Number of pages5
JournalRadiation Physics and Chemistry
Volume58
Issue number5-6
DOIs
Publication statusPublished - 2000 Jun 1
Externally publishedYes
Event6th International Workshop on Positron and Positronium Chemistry (PPC-6) - Tsukuba, Jpn
Duration: 1999 Jun 71999 Jun 11

ASJC Scopus subject areas

  • Radiation

Fingerprint Dive into the research topics of 'Characterization of the surface layer of LB-films using a slow positron beam'. Together they form a unique fingerprint.

Cite this