Characterization of thallium bromide crystals for radiation detector applications

K. Hitomi, M. Matsumoto, O. Muroi, T. Shoji, Y. Hiratate

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

In this study, thallium bromide (TlBr) crystals have been investigated for radiation detector applications. Thallium bromide crystals have been grown by the traveling molten zone method using materials purified by the conventional zone refining method. The grown crystals have been characterized in terms of their structural properties, stoichiometry and surface properties. Charge transport properties of the grown crystals have also been evaluated by estimating the carrier mobilities and lifetimes of electrons and holes. Room temperature radiation detectors have been fabricated from the grown crystals by depositing gold electrodes on the surfaces that had been treated by mechanical polishing and chemical etching. An energy resolution of 37.2 keV full-width at half-maximum (5.6%) has been recorded for 662 keV γ-rays with a TlBr detector at room temperature.

Original languageEnglish
Pages (from-to)129-133
Number of pages5
JournalJournal of Crystal Growth
Volume225
Issue number2-4
DOIs
Publication statusPublished - 2001 May 1

Keywords

  • A1. Characterization
  • A2. Travelling solvent zone growth
  • B2. Semiconducting materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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