Characterization of surface oxide layers formed on Fe-Al alloys by annealing under different atmospheres

Shigeru Suzuki, Takamichi Yamamoto, Kozo Shinoda, Shigeo Sato

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

XPS and SIMS were used for characterizing the surface oxide layers formed on Fe-Al alloys during annealing under atmospheres with different partial pressures of oxygen, which were controlled by H2O/H2 ratios in the gas. The XPS results showed that an aluminum oxide (Al 2O3) layer was formed on the surfaces of samples annealed at a high temperature under a low partial pressure of oxygen, while such a layer was not formed on the surfaces of samples annealed under a high partial pressure of oxygen. SIMS depth profiles showed that the surfaces of samples annealed at high temperatures under a low partial pressure of oxygen were covered with a thin Al2O3 layer of approximately 50 nm thickness. It was also shown that oxygen penetrated the samples annealed under a high partial pressure of oxygen, and the depth profile of oxygen was correlated with that of aluminum. This indicates that internal oxidation of aluminum occurs in the samples annealed under a high partial pressure of oxygen. Grazing-incidence X-ray diffraction (GIXD) was also employed for analyzing the structure of the Al2O3 layer formed on the surface of samples annealed under a low partial pressure of oxygen.

Original languageEnglish
Pages (from-to)311-314
Number of pages4
JournalSurface and Interface Analysis
Volume40
Issue number3-4
DOIs
Publication statusPublished - 2008 Mar

Keywords

  • Aluminum oxide
  • Depth profiling
  • Iron-based alloy
  • Secondary-ion mass spectrometry
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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