Characterization of native dislocations in chalcopyrite AgGaS2 by X-ray topography

I. Yonenaga, K. Sumino, E. Niwa, K. Masumoto

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16 Citations (Scopus)


The structural defects in annealed chalcopyrite AgGaS2 single crystals grown by the vertical gradient freezing method were investigated using X-ray topography. Dislocations with Burgers vector of the type b = 1/2[111] moving on {112}, b = [001] on {010} and b = 〈100〉 on {010} were identified within the crystals, as distinct from the preferential activation of b = 1/2[311] dislocations on {112} in the related compound CuFeS2. Twins formed due to the motion of dislocations with pure screw character of b = 1/6 [111] on {112} were also observed as similarly found for CuFeS2.

Original languageEnglish
Pages (from-to)616-620
Number of pages5
JournalJournal of Crystal Growth
Issue number3-4
Publication statusPublished - 1996 Oct
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry


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