Characterization of high-density patterned media fabricated by a new anodizing process

Nobuhiro Yasui, Sigeru Ichihara, Takashi Nakamura, Aya Imada, Tatsuya Saito, Yoshihiro Ohashi, Tohru Den, Kenji Miura, Hiroaki Muraoka

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Patterned media with dots of 65 nm period (153 Gdots in.2) and 25 nm period (1.03 Tdots in.2) fabricated by a new anodizing process were investigated. Write/read characteristics were successfully measured with a specific patterned marker providing an accessing method to the narrow patterned area of 10×10 μ m2. The read-back signals were obtained by a spin stand with a flying head and a static tester with a contact head. Although 1 dot resolution was not achieved in the flying write/read measurement for the media with 25 nm period (1.03 Tdots in.2), it was achieved in the contact write/read measurement.

Original languageEnglish
Article number07C515
JournalJournal of Applied Physics
Volume103
Issue number7
DOIs
Publication statusPublished - 2008 Apr 21

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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