Characterization of ferroelectric NaxK1-xNbO 3 system films prepared by pulsed laser deposition

Fengping Lai, Rong Tu, Takashi Goto, Jingfeng Li

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Ferroelectric NaxK1-xNbO3 (NKN) films were prepared on quartz and Pt/SrTiO3(100) substrates by pulsed laser deposition. The effects of composition and preparation conditions on the crystal structure and ferroelectricity of the NKN films were investigated by changing the Na content (x), substrate temperature (Tsub), oxygen partial pressure (PO2), target-to-substrate distance (Dt-s) and laser energy density (EL). The permittivity values of the NKN films were 390 to 520 at room temperature and 100 kHz, showing a maximum at x = 0.5. The maximum remnant polarization value was 8.2 × 10-2 C m -2 at x = 0.5.

Original languageEnglish
Pages (from-to)2076-2081
Number of pages6
JournalMaterials Transactions
Volume49
Issue number9
DOIs
Publication statusPublished - 2008 Sep

Keywords

  • Ferroelectricity
  • Pulse laser deposition
  • Sodium potassium niobate film

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Characterization of ferroelectric Na<sub>x</sub>K<sub>1-x</sub>NbO <sub>3</sub> system films prepared by pulsed laser deposition'. Together they form a unique fingerprint.

Cite this