Characterization of defects in Li2B4O7 crystals grown by Czochralski and Bridgman methods

Vincent Vezin, Tamotsu Sugawara, Ryuichi Komatsu, Satoshi Uda

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Lithium tetraborate (Li2B4O7) has attracted much attention as a surface acoustic wave substrate for high-frequency use and its excellent nonlinear optical properties have been recently found. In the present report, the main crystalline defects observed by X-ray topography in Li2B4O7 (110) wafers grown by the Bridgman method and by the Czochralski method are presented. The main trends observed are a majority of dislocations in {112} planes, a minority of dislocations in the {111} planes, and low-angle grain boundaries in both {111} and {112} planes.

Original languageEnglish
Pages (from-to)5950-5953
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume36
Issue number9 SUPPL. B
Publication statusPublished - 1997 Sep 1
Externally publishedYes

Keywords

  • Diffraction
  • Dislocation
  • Grain boundary
  • Lithium tetraborate
  • Topography

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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