Characterization of defects in Li2B4O7 crystals grown by Czochralski and Bridgman methods

Vincent Vezin; Tamotsu Sugawara; Ryuichi Komatsu; Satoshi Uda

Characterization of defects in Li₂B₄O₇ crystals grown by Czochralski and Bridgman methods

Vincent Vezin, Tamotsu Sugawara, Ryuichi Komatsu, Satoshi Uda

Research output: Contribution to journal › Article › peer-review

Abstract

Lithium tetraborate (Li₂B₄O₇) has attracted much attention as a surface acoustic wave substrate for high-frequency use and its excellent nonlinear optical properties have been recently found. In the present report, the main crystalline defects observed by X-ray topography in Li₂B₄O₇ (110) wafers grown by the Bridgman method and by the Czochralski method are presented. The main trends observed are a majority of dislocations in {112} planes, a minority of dislocations in the {111} planes, and low-angle grain boundaries in both {111} and {112} planes.

Original language	English
Pages (from-to)	5950-5953
Number of pages	4
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	36
Issue number	9 SUPPL. B
Publication status	Published - 1997 Sep 1
Externally published	Yes

Keywords

Diffraction
Dislocation
Grain boundary
Lithium tetraborate
Topography

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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Characterization of defects in Li₂B₄O₇ crystals grown by Czochralski and Bridgman methods. / Vezin, Vincent; Sugawara, Tamotsu; Komatsu, Ryuichi; Uda, Satoshi.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 36, No. 9 SUPPL. B, 01.09.1997, p. 5950-5953.

Research output: Contribution to journal › Article › peer-review

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AU - Uda, Satoshi

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