Characterization of damaged layer using AC surface photovoltagein silicon wafers

Osamu Kohmoto, Satoru Araki, Chester Alexander

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Ferromagnetic resonance in 1000-Ɨ-thick Co films evaporated on sapphire, glass or MgO substrates has been studied. An effective uniaxial anisotropy field (Hk) of -16.27 kOe and gyromagnetic ratio (े/2ॠ) of 3.10 GHz/kOe were obtained for Co film on sapphire. Assuming the saturation magnetization (4ॠM) of 17.58 kG, we derived a small intrinsic perpendicular anisotropy field (HkC4ॠM) of 1.31 kOe.

Original languageEnglish
Pages (from-to)3962-3963
Number of pages2
JournalJapanese journal of applied physics
Volume32
Issue number9 R
DOIs
Publication statusPublished - 1993 Sep
Externally publishedYes

Keywords

  • Anisotropy field
  • Cobalt
  • Evaporation
  • Fee
  • Ferromagnetic resonance
  • Film
  • Hcp
  • Linewidth
  • Resonance field

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Characterization of damaged layer using AC surface photovoltagein silicon wafers'. Together they form a unique fingerprint.

Cite this