Characterization of Cd1-xMnxTe crystals grown by the Bridgman method and the zone melt method

H. Sato, K. Onodera, H. Ohba

Research output: Contribution to journalConference article

4 Citations (Scopus)

Abstract

Cd1-xMnxTe crystals have been grown by a Bridgman method (BM) and by a zone melt method (ZM). While the BM-grown crystals have a heavy twin (A.E. Turner, R. Gunshor and S. Datta, Appl. Opt. 22 (1983) 3152.) the ZM-grown crystals have twin-free and a heavy striation in the growth direction (R. Triboulet, A. Heurtel and J. Rioux, J. Crystal Growth 101 (1990) 131.). These defects affect a extinction ratio as a function of crystal plane. Both crystals grown by two methods have the insertion loss of 0.3 dB at 0.66 μm, the extinction ratio of more than 30 dB in these (1 1 1) crystal planes at 0.66 μm and these crystals have a large size (20 mm diameter × 40 mm length). While the distribution of the Faraday rotated angle × 30 mm length of the BM-grown crystal is 45 ± 3.5°, that of the ZM-grown crystal is 45 ± 0.3°. The uniformity of the Faraday rotated angle of the ZM-grown crystal is more stable than that of the BM-grown crystal. We have demonstrated crystal growth by the zone melt method (ZM) with the aim of the commercial production of a 45° Faraday rotator with a low cost and a high performance.

Original languageEnglish
Pages (from-to)885-888
Number of pages4
JournalJournal of Crystal Growth
Volume214
DOIs
Publication statusPublished - 2000 Jun 2
Externally publishedYes
EventThe 9th International Conference on II-VI Compounds - Kyoto, Jpn
Duration: 1999 Nov 11999 Nov 5

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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