Characterization of a Fresnel zone plate using higher-order diffraction

Akihisa Takeuchi; Yoshio Suzuki; Hidekazu Takano

doi:10.1107/S0909049502004740

Characterization of a Fresnel zone plate using higher-order diffraction

Akihisa Takeuchi, Yoshio Suzuki, Hidekazu Takano

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

The performance of a Fresnel zone plate has been tested by observing the focusing property of higher-order diffraction. The Fresnel zone plate was fabricated by the electron-beam lithography technique. The zone material was made from 1 μm-thick tantalum and the outermost zone width was 0.25 μm. The third-order focused spot size measured by the knife-edge scan method was 0.1 μm full width at half-maximum at an X-ray energy of 8 keV, which is exactly equal to one-third of the first-order focal spot size.

Original language	English
Pages (from-to)	115-118
Number of pages	4
Journal	Journal of Synchrotron Radiation
Volume	9
Issue number	3
DOIs	https://doi.org/10.1107/S0909049502004740
Publication status	Published - 2002 May 1
Externally published	Yes

Keywords

Fresnel zone plates
Higher-order diffraction
X-ray microbeams

ASJC Scopus subject areas

Radiation
Nuclear and High Energy Physics
Instrumentation

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10.1107/S0909049502004740

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@article{294fbb2d99a540d48b8d93158a76b987,

title = "Characterization of a Fresnel zone plate using higher-order diffraction",

abstract = "The performance of a Fresnel zone plate has been tested by observing the focusing property of higher-order diffraction. The Fresnel zone plate was fabricated by the electron-beam lithography technique. The zone material was made from 1 μm-thick tantalum and the outermost zone width was 0.25 μm. The third-order focused spot size measured by the knife-edge scan method was 0.1 μm full width at half-maximum at an X-ray energy of 8 keV, which is exactly equal to one-third of the first-order focal spot size.",

keywords = "Fresnel zone plates, Higher-order diffraction, X-ray microbeams",

author = "Akihisa Takeuchi and Yoshio Suzuki and Hidekazu Takano",

year = "2002",

month = may,

day = "1",

doi = "10.1107/S0909049502004740",

language = "English",

volume = "9",

pages = "115--118",

journal = "Journal of Synchrotron Radiation",

issn = "0909-0495",

publisher = "International Union of Crystallography",

number = "3",

}

TY - JOUR

T1 - Characterization of a Fresnel zone plate using higher-order diffraction

AU - Takeuchi, Akihisa

AU - Suzuki, Yoshio

AU - Takano, Hidekazu

PY - 2002/5/1

Y1 - 2002/5/1

N2 - The performance of a Fresnel zone plate has been tested by observing the focusing property of higher-order diffraction. The Fresnel zone plate was fabricated by the electron-beam lithography technique. The zone material was made from 1 μm-thick tantalum and the outermost zone width was 0.25 μm. The third-order focused spot size measured by the knife-edge scan method was 0.1 μm full width at half-maximum at an X-ray energy of 8 keV, which is exactly equal to one-third of the first-order focal spot size.

AB - The performance of a Fresnel zone plate has been tested by observing the focusing property of higher-order diffraction. The Fresnel zone plate was fabricated by the electron-beam lithography technique. The zone material was made from 1 μm-thick tantalum and the outermost zone width was 0.25 μm. The third-order focused spot size measured by the knife-edge scan method was 0.1 μm full width at half-maximum at an X-ray energy of 8 keV, which is exactly equal to one-third of the first-order focal spot size.

KW - Fresnel zone plates

KW - Higher-order diffraction

KW - X-ray microbeams

UR - http://www.scopus.com/inward/record.url?scp=0036587425&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036587425&partnerID=8YFLogxK

U2 - 10.1107/S0909049502004740

DO - 10.1107/S0909049502004740

M3 - Article

AN - SCOPUS:0036587425

VL - 9

SP - 115

EP - 118

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

SN - 0909-0495

IS - 3

ER -

Characterization of a Fresnel zone plate using higher-order diffraction

Abstract

Keywords

ASJC Scopus subject areas

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