Abstract
The characterization and modeling of tunnel barrier reliability was done. The dielectric breakdown of ferromagnetic tunnel junctions (MTJ) was investigated by means of current sweep experiments and time-to-breakdown measurements. The junction area dependence of the breakdown voltage was studied.
| Original language | English |
|---|---|
| Pages (from-to) | BB06 |
| Journal | Digests of the Intermag Conference |
| Publication status | Published - 2002 Dec 1 |
| Externally published | Yes |
| Event | 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering