Characterization and modeling of tunnel barrier reliability

Kentaro Nakajima, Minoru Amano, Misayuki Sagoi, Yoshiaki Saito

Research output: Contribution to journalConference articlepeer-review

Abstract

The characterization and modeling of tunnel barrier reliability was done. The dielectric breakdown of ferromagnetic tunnel junctions (MTJ) was investigated by means of current sweep experiments and time-to-breakdown measurements. The junction area dependence of the breakdown voltage was studied.

Original languageEnglish
Pages (from-to)BB06
JournalDigests of the Intermag Conference
Publication statusPublished - 2002 Dec 1
Externally publishedYes
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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