Characteristics of total reflection X-ray excited current detected with the tip of a scanning tunneling microscope

Kouichi Tsuji, Kazuaki Wagatsuma, Kichinosuke Hirokawa

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have studied the current between a sample subject to irradiation by X-rays and the tip of a scanning tunneling microscope. The dependence on incident angle of both this current and the X-ray fluorescence from the sample was measured for Au, Co and Ti thin films with X-rays of different wavelengths. The angular dependence of the current agreed with that of X-ray fluorescence under vacuum conditions. As a result, it was confirmed that the tip current originated from electrons emitted from the sample surface. It was also found that the tip current depended on both the wavelength of the primary radiation and the type of sample.

Original languageEnglish
Pages (from-to)855-860
Number of pages6
JournalSpectrochimica Acta - Part B Atomic Spectroscopy
Volume52
Issue number7
DOIs
Publication statusPublished - 1997 Jul 1

Keywords

  • Scanning tunneling microscope
  • Total reflection
  • X-ray excited current
  • X-ray fluorescence

ASJC Scopus subject areas

  • Analytical Chemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Spectroscopy

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