Characteristic length scale of bicontinuous nanoporous structure by fast Fourier transform

Takeshi Fujita, Mingwei Chen

Research output: Contribution to journalArticlepeer-review

68 Citations (Scopus)

Abstract

We propose a method derived from fast Fourier transform (FFT) process to measure the characteristic length scale of bicontinuous nanoporous structures. By rotationally averaging the FFT power spectrum of a nanoporous micrograph from scanning electron microscope (SEM) or transmission electron microscope (TEM), a significant peak in the power spectrum can be obtained, which reflects the characteristic length scale of the quasi-periodic structure. This method is demonstrated for the bicontinuous morphology that is frequently observed in nanoporous metals prepared by chemical or electrochemical dealloying.

Original languageEnglish
Pages (from-to)1161-1163
Number of pages3
JournalJapanese journal of applied physics
Volume47
Issue number2 PART 1
DOIs
Publication statusPublished - 2008 Feb 15

Keywords

  • Dealloying
  • Image analysis
  • Nanoporous gold
  • Scanning electron microscopy (SEM)
  • Transmission electron microscopy (TEM)

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Characteristic length scale of bicontinuous nanoporous structure by fast Fourier transform'. Together they form a unique fingerprint.

Cite this