Abstract
Ceria doped yttria stabilized zirconia (ZrO2-CeO2-Y2O3 system) shows electron-ion mixed conduction at high temperatures under a reduced atmosphere. In this system, the electronic conductivity is caused by electrons, which may diffuse by hopping conduction between Ce4+ and Ce3+. We applied the electronic Raman scattering technique on the system in order to measure the concentration of Ce3+ in samples. For the X = 0.6 and 0.8 samples in [(ZrO2)1-X (CeO2)X]0.9(Y2O3)0.1, the oxygen partial pressure dependence of the electronic Raman intensities agrees well with that of the oxygen non-stoichiometry measured by thermogravimetry. From this result, it is confirmed that all of the introduced electrons at reduced condition are trapped at cerium centers in these materials.
Original language | English |
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Pages (from-to) | 663-667 |
Number of pages | 5 |
Journal | Solid State Ionics |
Volume | 135 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - 2000 Nov 1 |
ASJC Scopus subject areas
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics