CD14 and IL4R gene polymorphisms modify the effect of day care attendance on serum IgE levels

Yoichi Suzuki; Satoshi Hattori; Yoichi Mashimo; Makiko Funamizu; Yoichi Kohno; Yoshitaka Okamoto; Akira Hata; Naoki Shimojo

doi:10.1016/j.jaci.2009.03.035

CD14 and IL4R gene polymorphisms modify the effect of day care attendance on serum IgE levels

Yoichi Suzuki, Satoshi Hattori, Yoichi Mashimo, Makiko Funamizu, Yoichi Kohno, Yoshitaka Okamoto, Akira Hata, Naoki Shimojo

Tohoku Medical Megabank Organization (ToMMo)

Research output: Contribution to journal › Letter › peer-review

14 Citations (Scopus)

Original language	English
Pages (from-to)	1408-1411.e1
Journal	Journal of Allergy and Clinical Immunology
Volume	123
Issue number	6
DOIs	https://doi.org/10.1016/j.jaci.2009.03.035
Publication status	Published - 2009 Jun

ASJC Scopus subject areas

Immunology and Allergy
Immunology

Access to Document

10.1016/j.jaci.2009.03.035

Cite this

CD14 and IL4R gene polymorphisms modify the effect of day care attendance on serum IgE levels. / Suzuki, Yoichi; Hattori, Satoshi; Mashimo, Yoichi; Funamizu, Makiko; Kohno, Yoichi; Okamoto, Yoshitaka; Hata, Akira; Shimojo, Naoki.

In: Journal of Allergy and Clinical Immunology, Vol. 123, No. 6, 06.2009, p. 1408-1411.e1.

Research output: Contribution to journal › Letter › peer-review

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AU - Hata, Akira

AU - Shimojo, Naoki

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