Cation sublattice stacking faults in Cu-rich chalcopyrite CuInSe2

Olof Hellman, Shunichiro Tanaka, Shigeru Niki, Paul Fons

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Using transmission electron microscopy, we have found stacking faults on the cation sublattice in the chalcopyrite structure of CuInSe2. These films are grown by molecular beam epitaxy under Cu-rich conditions. These stacking faults are found to extend large distances in the plane of the film, and are not found to be present in samples not grown in Cu-rich conditions. We suggest that this defect is triggered by a Cu-induced transformation of the surface structure of the growing film.

Original languageEnglish
Pages (from-to)1398-1402
Number of pages5
JournalJournal of Materials Research
Volume11
Issue number6
DOIs
Publication statusPublished - 1996 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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