Cathodoluminescence in Scanning and Transmission Electron Microscopies

Yutaka Ohno, Seiji Takeda

Research output: Chapter in Book/Report/Conference proceedingChapter

1 Citation (Scopus)
Original languageEnglish
Title of host publicationIn-Situ Electron Microscopy
Subtitle of host publicationApplications in Physics, Chemistry and Materials Science
PublisherWiley-VCH
Pages303-319
Number of pages17
ISBN (Print)9783527319732
DOIs
Publication statusPublished - 2012 Apr 24

Keywords

  • Carrier capture cross-sections
  • Carrier lifetimes
  • Cathodoluminescence
  • Defects
  • Diffusion lengths
  • Localized energy levels
  • Nanostructures
  • Near-field optical measurements
  • Semiconducting materials

ASJC Scopus subject areas

  • Chemistry(all)

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