Calibration process for the Young's modulus of a mechanically trapped microbead measured by atomic force microscopy

Di Chang, Takahiro Hirate, Chihiro Uehara, Nobuyuki Uozumi, Fumihito Arai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper reports the measurement of the mechanical property of a trapped microbead using atomic force microscopy (AFM). The influence of the AFM sample immobilization method, which is called mechanical trapping method, is calibrated according to simulation software and force analysis. The calibration accuracy is verified using some PDMS beads.

Original languageEnglish
Title of host publicationMHS 2019 - 30th 2019 International Symposium on Micro-NanoMechatronics and Human Science
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728126746
DOIs
Publication statusPublished - 2019 Dec 1
Event30th International Symposium on Micro-NanoMechatronics and Human Science, MHS 2019 - Nagoya, Japan
Duration: 2019 Dec 12019 Dec 4

Publication series

NameMHS 2019 - 30th 2019 International Symposium on Micro-NanoMechatronics and Human Science

Conference

Conference30th International Symposium on Micro-NanoMechatronics and Human Science, MHS 2019
CountryJapan
CityNagoya
Period19/12/119/12/4

ASJC Scopus subject areas

  • Biomedical Engineering
  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Modelling and Simulation
  • Instrumentation

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