Calibration and compensation of near-field scan measurements

Jin Shi, Michael A. Cracraft, Kevin P. Slattery, Masahiro Yamaguchi, Richard E. DuBroff

Research output: Contribution to journalArticle

62 Citations (Scopus)

Abstract

A procedure for the calibration and compensation of near-field scanning is described and demonstrated. Ultimately, the objective is to quantify the individual field components associated with electromagnetic interference (EMI) from high speed circuitry and devices. Specific examples of these methods are shown. The effects of compensation are small but noticeable when the uncompensated output signal from near field scanning is already a very good representation of the field being measured. In other cases, the improvement provided by compensation can be significant when the uncompensated output signal bears little resemblance to the underlying field.

Original languageEnglish
Pages (from-to)642-650
Number of pages9
JournalIEEE Transactions on Electromagnetic Compatibility
Volume47
Issue number3
DOIs
Publication statusPublished - 2005 Aug 1

Keywords

  • Calibration
  • Compensation
  • Near-field probes
  • Near-field scanning

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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