Calculation of Noise Intensity in the Frequency Demodulation for Atomic Force Microscopy

Yukio Hasegawa, Toyoaki Eguchi, Toshu An, Masanori Ono, Kotone Akiyama, Toshio Sakuf

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Noise intensity in the resonance frequency shift (Δf) signal of the cantilever oscillation, which is an indirect measure of force in non-contact atomic force microscopy, was calculated and compared with those measured experimentally. It is found that the output noise amplitude is proportional to the ratio of noise to the oscillation amplitude measured at the input of the frequency demodulator. Our analysis indicates that improving the sensitivity to cantilever deflection can reduce the noise in the Δf signal.

Original languageEnglish
Pages (from-to)L303-L305
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume43
Issue number2 B
DOIs
Publication statusPublished - 2004 Feb 15

Keywords

  • Electrical noise
  • Frequency demodulation
  • Frequency shift
  • Noise spectrum
  • Non-contact atomic force microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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