Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2

K. Terashima, J. Sonoyama, M. Sunagawa, H. Fujiwara, T. Nagayama, T. Muro, M. Nagao, S. Watauchi, I. Tanaka, H. Okazaki, Y. Takano, Y. Mizuguchi, H. Usui, K. Suzuki, K. Kuroki, T. Wakita, Y. Muraoka, T. Yokoya

    Research output: Contribution to journalConference article

    1 Citation (Scopus)

    Abstract

    Bulk electronic structure of novel layered superconductor Nd(O,F)BiS2 was studied by using soft x-ray angle-resolved photoelectron spectroscopy (ARPES). Electron-like Fermi surface centered at the X(R) point was observed, consistent with earlier ARPES reports on surface-sensitive VUV light source. Based on the comparison of the electronic structure between Nd(O,F)BiS2 and La(O,F)BiS2, we discuss possible important factors for the superconductivity in this series of material.

    Original languageEnglish
    Article number012003
    JournalJournal of Physics: Conference Series
    Volume683
    Issue number1
    DOIs
    Publication statusPublished - 2016 Feb 5
    EventTMU International Symposium on New Quantum Phases Emerging from Novel Crystal Structure - Tokyo, Japan
    Duration: 2015 Sep 242015 Sep 25

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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  • Cite this

    Terashima, K., Sonoyama, J., Sunagawa, M., Fujiwara, H., Nagayama, T., Muro, T., Nagao, M., Watauchi, S., Tanaka, I., Okazaki, H., Takano, Y., Mizuguchi, Y., Usui, H., Suzuki, K., Kuroki, K., Wakita, T., Muraoka, Y., & Yokoya, T. (2016). Bulk sensitive angle-resolved photoelectron spectroscopy on Nd(O,F)BiS2. Journal of Physics: Conference Series, 683(1), [012003]. https://doi.org/10.1088/1742-6596/683/1/012003