Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films

Zhi Mei Qi, Mingdeng Wei, Hirofumi Matsuda, Itaru Honma, Haoshen Zhou

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

Here the authors report the spectral surface plasmon resonance (SPR) behavior of thin gold films covered with dielectric layers. With the SPR sensor angular dependence of the resonant wavelength and refractive-index (RI) sensitivity at a specific angle were measured by broadband absorption spectroscopy. By fitting the calculated SPR absorption spectrum to the experimental result, RI dispersion of a Ti O2 -nanoparticle/polymer composite layer was obtained, which was compared with the ellipsometry data. The phase spectra of the sensor were calculated, and a large response of the phase to the solution RI was observed around the resonant wavelength.

Original languageEnglish
Article number181112
JournalApplied Physics Letters
Volume90
Issue number18
DOIs
Publication statusPublished - 2007 May 10
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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