Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam

Yukio Takahashi, Akihiro Suzuki, Shin Furutaku, Kazuto Yamauchi, Yoshiki Kohmura, Tetsuya Ishikawa

Research output: Contribution to journalArticlepeer-review

69 Citations (Scopus)

Abstract

We experimentally demonstrate the visualization of nanoscale dislocation strain fields in a thick silicon single crystal by a coherent diffraction imaging technique called Bragg x-ray ptychography. We also propose that the x-ray microbeam carrying orbital angular momentum is selectively produced by coherent Bragg diffraction from dislocation singularities in crystals. This work not only provides us with a tool for characterizing dislocation strain fields buried within extended crystals but also opens up new scientific opportunities in femtosecond spectroscopy using x-ray free-electron lasers.

Original languageEnglish
Article number121201
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume87
Issue number12
DOIs
Publication statusPublished - 2013 Mar 7
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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