Bond lengths in Ge1-xSix crystalline alloys grown by the Czochralski method

Ichiro Yonenaga, M. Sakurai

Research output: Contribution to journalArticlepeer-review

36 Citations (Scopus)

Abstract

We measured the effect of alloy composition on the atomic bonding in bulk Ge1-xSix alloys grown by the Czochralski method across the whole composition range 0<x<1. Extended x-ray-absorption fine-structure measurements performed at the Ge K edge at 20 K found that the Ge-Ge and Ge-Si bond lengths maintain distinctly different lengths and vary linearly with alloy composition. The topological rigidity parameter, estimated from the measured bond lengths, is around 0.6, which indicates that the bond lengths and bond angles are distorted with alloy composition.

Original languageEnglish
Article number113206
Pages (from-to)1132061-1132063
Number of pages3
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume64
Issue number11
Publication statusPublished - 2001 Sep 15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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