Bias-voltage application in hard x-ray photoelectron spectroscopy for characterization of advanced materials

Yoshiyuki Yamashita; Kenji Ohmori; Shigenori Ueda; Hideki Yoshikawa; Toyohiro Chikyow; Keisuke Kobayashi

doi:10.1380/ejssnt.2010.81

Bias-voltage application in hard x-ray photoelectron spectroscopy for characterization of advanced materials

Yoshiyuki Yamashita, Kenji Ohmori, Shigenori Ueda, Hideki Yoshikawa, Toyohiro Chikyow, Keisuke Kobayashi

Advanced Institute for Materials Research (AIMR)

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

We employed bias-voltage-application in hard x-ray photoelectron spectroscopy (BA-HXPES) to detect electronic states of materials in operating devices. To demonstrate the versatility of this method, we used a metal/SiO ₂/Si(100) structure as an ideal platform and found that electronic states at the SiO₂/Si(100) interface were changed depending on the bias-application to the structure. By analyzing the change as a function of bias-voltage, the interface electronic states in the whole Si gap have been directly obtained in which these states cannot be detected without the bias-application. BA-HXPES is a new method to characterize electronic states for advanced materials under device operation.

Original language	English
Pages (from-to)	81-83
Number of pages	3
Journal	e-Journal of Surface Science and Nanotechnology
Volume	8
DOIs	https://doi.org/10.1380/ejssnt.2010.81
Publication status	Published - 2010 Feb 27

Keywords

Crystalline-amorphous interfaces
Silicon
X-ray photoelectron spectroscopy

ASJC Scopus subject areas

Biotechnology
Bioengineering
Condensed Matter Physics
Mechanics of Materials
Surfaces and Interfaces
Surfaces, Coatings and Films

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Bias-voltage application in hard x-ray photoelectron spectroscopy for characterization of advanced materials. / Yamashita, Yoshiyuki; Ohmori, Kenji; Ueda, Shigenori; Yoshikawa, Hideki; Chikyow, Toyohiro; Kobayashi, Keisuke.

In: e-Journal of Surface Science and Nanotechnology, Vol. 8, 27.02.2010, p. 81-83.

Research output: Contribution to journal › Article › peer-review

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