Bending stress- and magnetic field-dependence of Ic in JFCA-RRT samples

K. Noto, Y. Fujine, T. Sato, S. Shirato, Y. Nagasawa, T. Kikegawa, K. Watanabe, Y. Kimura, T. Kaneko, A. Kimura

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Japan Fine Ceramics Association has carried out a round robin test (RRT) on the bending strain (b) dependence of the critical current Ic at 77 K in three kinds of Bi(2223)/Ag tape samples (VAM-1, JFC-1, JFC-2; three samples each) for future standardization. We measured Ic(b) (b: 0-1.0%) as one of RRT participants and also measured the magnetic field dependence of Ic under several bending strains mentioned above as optional measurements. As results, we found a very fast decrease of Ic in low fields up to 0.5 T and then a gradual decrease up to 1.5-2.0 T. Ic maintains 0.9-0.95 of its initial value up to b=0.4% strain and then decreases a little faster down to 0.60-0.65 at b=1.0% for almost all samples and magnetic fields. The normalized pinning force Fp/Fpmax shows scaling according to the expression Fp/Fpmax∝(B/Birr)(1-(B/Birr)) 3 for all samples and bending strains, where Birr is the irreversibility field.

Original languageEnglish
Pages (from-to)12-15
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume382
Issue number1
DOIs
Publication statusPublished - 2002 Oct 15

Keywords

  • Bending strain
  • Bi-2223/Ag tape
  • Critical current
  • Round robin test
  • Scaling

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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