Beam test of the SDC double-sided silicon strip detector

Y. Unno, F. Hinode, T. Akagi, T. Kohriki, N. Ujiie, Y. Iwata, T. Ohmoto, T. Ohsugi, T. Ohyama, T. Hatakenaka, N. Tamura, S. Kobayashi, A. Murakami, M. Tezuka, R. Takashima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A beam test was executed to evaluate the behavior of the first prototype radiation-hard double-sided silicon microstrip sensor for the SDC silicon tracking system. Pions of 4 GeV/c in a test beamline at KEK illuminated three planes of detectors. The signals were amplified, shaped, and discriminated with TEKZ bipolar analog LSI's, and the on-off levels were sampled at 10MHz clock with CMOS digital LSI's, asynchronously with beam triggers. The detectors were rotated in null and 1.0 Tesla magnetic fields. The efficiencies were found to be 98approx.99%. The position resolutions were 12.5μm, where the multi-strip hit fraction was 30-40%. There was no essential difference in the performance of the p-and the n-sides. The multi-strip hit fraction showed a clear rotation and magnetic-field dependence. From the angles where the fractions were minimum in the 1T magnetic field, the Hall mobilities of the electrons and holes were obtained to be 1391±43 (electrons) and 325±30 (holes) cm2/Vs.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium & Medical Imaging Conference
PublisherPubl by IEEE
Pages38-42
Number of pages5
Editionpt 1
ISBN (Print)0780314883
Publication statusPublished - 1994
EventProceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference - San Francisco, CA, USA
Duration: 1993 Oct 301993 Nov 6

Publication series

NameIEEE Nuclear Science Symposium & Medical Imaging Conference
Numberpt 1

Other

OtherProceedings of the 1993 IEEE Nuclear Science Symposium & Medical Imaging Conference
CitySan Francisco, CA, USA
Period93/10/3093/11/6

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Industrial and Manufacturing Engineering

Fingerprint Dive into the research topics of 'Beam test of the SDC double-sided silicon strip detector'. Together they form a unique fingerprint.

  • Cite this

    Unno, Y., Hinode, F., Akagi, T., Kohriki, T., Ujiie, N., Iwata, Y., Ohmoto, T., Ohsugi, T., Ohyama, T., Hatakenaka, T., Tamura, N., Kobayashi, S., Murakami, A., Tezuka, M., & Takashima, R. (1994). Beam test of the SDC double-sided silicon strip detector. In IEEE Nuclear Science Symposium & Medical Imaging Conference (pt 1 ed., pp. 38-42). (IEEE Nuclear Science Symposium & Medical Imaging Conference; No. pt 1). Publ by IEEE.