BACKGROUND X-RAYS OF PIXE ANALYSIS.

K. Ozawa, J. H. Chang, Y. Yamamoto, T. Sebe, S. Morita, Keizo Ishii

Research output: Contribution to journalConference articlepeer-review

Abstract

Background X-rays from an Al target bombarded with protons of 0. 5, 0. 75 and 1. 0 MeV and alpha -particles of 0. 5 MeV/amu from the 2. 5 MV Van de Graff accelerator were measured with a Si(Li) detector. Production cross section and spectra of continuum X-rays are compared with predictions from the atomic bremsstrahlung (AB) and the secondary electron bremsstrahlung (SEB). Good agreements are obtained. Atomic bremsstrahlung is the most predominant process in this projectile-energy region. The experimental angular distribution of 2. 85-3. 00 keV X-rays for 0. 5-MeV proton bombardment is also in good agreement with the calculation of atomic bremsstrahlung. This distribution is symmetric about 90 degree with respect to the incident beam. These results make possible estimation of the sensitivity of the trace-element analysis by PIXE.

Original languageEnglish
Pages (from-to)37-45
Number of pages9
JournalReport of Research Center of Ion Beam Technology, Hosei University. Supplement
Publication statusPublished - 1986 Dec 1

ASJC Scopus subject areas

  • Engineering(all)

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