Average and local structures of amorphous Pd75Si25 alloy analyzed by modern electron diffraction techniques

Yoshihiko Hirotsu, Mitsuhide Matsushita, Tadakatsu Ohkubo, Akihiro Makino, Tetsuo Oikawa

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

In order to develop electron diffraction structure analysis methods for both average and local structures of amorphous alloys, halo-electron diffraction intensity and nano-probe electron diffraction intensity analyses were performed for amorphous Pd75Si25 alloy thin firms. In the halo-diffraction intensity analysis, intensities were recorded using 'imaging plates' and inelastic intensities were removed by using an energy-filter. Atomic Pd-Pd and Pd-Si distances and the number of Pd-Pd nearest neighbors were determined from the atomic pair distribution function analysis (PDF). To analyze local structure, especially medium-range order (MRO), nano-probe electron diffraction with a probe size of 1-1.5 nm was applied with the help of high-resolution electron microscopy (HREM) observation. It was found that the structure of MRO is hexagonal of the Pd2Si-type with lattice parameters a = 0.715 and c = 0.312 nm. Atomic distances of Pd-Pd and Pd-Si and the number of Pd-Pd nearest neighbors obtained from the nano-diffraction structure analysis were in good agreement with those from the PDF analysis.

Original languageEnglish
Pages (from-to)274-279
Number of pages6
JournalMaterials Science and Engineering A
Volume226-228
DOIs
Publication statusPublished - 1997 Jun 15

Keywords

  • Atomic medium-range order
  • Energy filtering
  • High-resolution electron microscopy
  • Imaging plate
  • Nano-diffraction
  • Pair distribution function

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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