Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF4

E. Shigemasa, T. Hayaishib, K. Okuno, A. Danjo, K. Ueda, Y. Sato, A. Yagishita

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

In order to elucidate state-to-state dissociation dynamics of inner-shell photoexcited molecules, we have investigated ionic fragmentations by energy-resolved Auger-electron-photoion coincidence techniques. Results are presented for the fragmentation of SiF4 following the Si 2p photoionization. It is found that the fragmentation patterns strongly depend on the Auger final states. The dissociation pathways are discussed on the basis of comparison between the present results and the appearance potential of the ionic species and ion pairs in the literature.

Original languageEnglish
Pages (from-to)495-498
Number of pages4
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume79
DOIs
Publication statusPublished - 1996 May

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

Fingerprint

Dive into the research topics of 'Auger-electron-photoion coincidence studies on ionic fragmentation following the Si 2p ionization of SiF<sub>4</sub>'. Together they form a unique fingerprint.

Cite this