Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

Toshu An, Takahiro Nishio, Toyoaki Eguchi, Masanori Ono, Atsushi Nomura, Kotone Akiyama, Yukio Hasegawa

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si (111) - (7×7) surface was successfully obtained.

Original languageEnglish
Article number033703
JournalReview of Scientific Instruments
Volume79
Issue number3
DOIs
Publication statusPublished - 2008
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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