Atomically resolved imaging by frequency modulation atomic force microscopy using length extension quartz resonator

Toshu An, Toyoaki Eguchi, Yukio Hasegawa

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)687-690
Number of pages4
JournalSeimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering
Issue number7
Publication statusPublished - 2008 Jul


  • Atomic force microscopy
  • Frequency modulation
  • Low temperature atomic force microscopy
  • Quartz resonator
  • Small oscillation amplitude

ASJC Scopus subject areas

  • Mechanical Engineering

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